氧化铝的X射线荧光光谱分析方法研讨  

Study on the Measurement of Alumina by X-Ray Fluorescence Spectrometry

作　　者：陈泓钧 

机构地区：[1]山东南山集团技术中心山东省龙口市徐福镇东海工业园铝业公司中心实验室,265713

出　　处：《光谱实验室》2008年第6期1273-1275,共3页Chinese Journal of Spectroscopy Laboratory

摘　　要：简要论述了氧化铝的X射线荧光光谱分析方法原理、样品处理、设备特点;在德国布鲁克公司的S4型X射线荧光光谱仪上用融片法分析氧化铝中的杂质含量,重点论述了用X射线荧光光谱法代替传统的化学分析方法的优势和不足。The analytical principle,sample preparation and instrument property of the measurement of alumina were described.The impurities in alumina were analyzed by X-ray fluorescence spectrometer with fusion sample preparation,and the advantage and disadvantage of X-ray fluorescence spectrometry replacing the wet chemical analysis method were discussed.

关 键 词：X射线荧光光谱分析 样品处理 氧化铝 

分 类 号：O657.34[理学—分析化学]