基于MSP430单片机的晶化监控系统设计与实现  

The design and implementation of a crystallization monitoring control system based on the MSP430 single-chip microprocessor

作　　者：张万宏[1] 王晓兰 王玮冬 

机构地区：[1]青海大学化工学院,青海西宁810016 [2]甘肃省有色金属新材料省部共建国家重点实验室,甘肃兰州730050

出　　处：《工业仪表与自动化装置》2008年第6期23-25,56,共4页Industrial Instrumentation & Automation

基　　金：甘肃省有色金属新材料国家重点实验室开放基金自治项目(SKL05010);甘肃省自然科学基金资助项目(ZS022-A25-039)

摘　　要：针对非晶材料晶化过程的电特性,提出了晶化温度控制和电阻率测试的总体设计方案,介绍了监控系统硬件和软件设计,并具体设计了以MSP430单片机为核心的智能温度控制和电阻率测试装置。试验结果表明该系统既提高了控制精度和可靠性,降低了开发成本,又能准确及时地实现非晶材料晶化过程电特性的在线动态研究。According to the electric property of the crystallization process of an amorphous material, the paper presents the design of a temperature monitor and a resistivity meter as well as the configuration of the hardware and software based on the MSP430 single - chip microprocessor. The result from its application shows that this system has not only improved the control accuracy and reliability, but also reduced its development cost and offered an occasion for bringing about in time an on - line dynamic study of the electric property of the crystallization process.

关 键 词：晶化监控 组合自校正 MSP430 

分 类 号：TP368[自动化与计算机技术—计算机系统结构]