对数正态分布下基于MAM的VFD加速寿命试验研究  

Study on Accelerated Life Test of VFD Based on MAM under the Lognormal Distribution

作　　者：张建平[1,2] 王睿韬[2] 

机构地区：[1]上海电力学院计算机与信息工程学院,上海200090 [2]上海大学自动化系,上海200072

出　　处：《电子器件》2008年第6期1735-1738,1742,共5页Chinese Journal of Electron Devices

基　　金：上海市教委一般科研项目资助(06LZ012);上海市教委2007年度重点课程建设项目资助(20075302);上海市重点科技攻关计划资助(071605125)

摘　　要：为了在较短时间内掌握真空荧光显示器(VFD)的寿命信息,节省寿命试验时间,通过开展两组恒定应力加速寿命试验和一组步进应力加速寿命试验,采用对数正态分布函数描述VFD的寿命分布,在图分析法(MAM)的基础上,基于MAT-LAB软件强大的计算和可视化绘图功能,绘制了对数正态概率双坐标纸,估计了对数均值和对数标准方差,完成了VFD恒定应力和步进应力加速寿命试验数据的统计和分析。结果表明,VFD寿命服从对数正态分布,其加速模型符合阿伦尼斯方程,基于MATLAB的图分析法来实现寿命数据处理是可行的,精确估算的加速参数使得快速预测VFD寿命成为可能。In order to acquire the life information of vacuum fluorescent display （VFD） within shorter time and save life test time, two constant stress accelerated life tests and a set of step stress accelesated life test were conducted. The statistic and the analyses on constant-step stress test data of VFD were achieved by applying the lognormal distribution to describing the life, and the powerful calculation and visual plotting function of MATLAB to plotting double coordinates of lognormal probability paper, which is based on map analysis method （MAM）. Moreover, the mean value and standard deviation of logarithm were estimated. The results show that the VFD life follows lognormal distribution, the accelerated model meets Arrhenius equation, and that life data processing is feasible by MAM based on MATLAB, the accelerated parameters of accurate calculation enables rapid estimation of VFD life.

关 键 词：真空荧光显示器 加速寿命试验 对数正态分布 图分析法 

分 类 号：TN141[电子电信—物理电子学] O212[理学—概率论与数理统计]