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作 者:戴达勇
出 处:《广东化工》2008年第12期112-113,共2页Guangdong Chemical Industry
摘 要:以电感耦合体原子发射光谱法(ICP-AES)直接同时对低碳铬铁中微量杂质元素Mn、P进行测定,优化了仪器条件,采取加入基体和钇内标校正的方法消除了试液进样的物理化学影响干扰。精密度、标准样品分析对照均取得了满意的结果。In the paper, trace of impurity element Mn and P in low carbon ferrochromium were determinated simultaneously by ICP-AES. The instrument operating conditions were optimized, and the physical chemistry disturbance of introduced test solution was eliminated using correlation methods with addtion matrix and Yt as internal standard. The results of the precision of the method and the control analysis of standard sample were satisfacted.
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