HIRFL-CSR实验环中束流损失机制及寿命研究  

Loss Mechanism and Lifetime of Ion Beam in HIRFL-CSRe

作　　者：薛迎利[1,2] 蔡晓红[1] 于得洋[1] 

机构地区：[1]中国科学院近代物理研究所,甘肃兰州730000 [2]中国科学院研究生院,北京100049

出　　处：《原子核物理评论》2008年第4期355-361,共7页Nuclear Physics Review

基　　金：国家自然科学基金资助项目(10375080,10775160)~~

摘　　要：分析了在储存环中回旋的离子束与残余气体分子、内靶和冷却电子束相互作用时的损失机制及相应的束流寿命,针对兰州重离子加速器冷却储存环实验环内靶模式,计算了50—500MeV/u12C6+,36Ar18+,132Xe54+和238U92+等束流在各种损失机制影响下所对应的束流寿命和总的束流寿命。结果表明:影响束流寿命的主要因素是与内靶分子(原子)之间的电荷交换及与冷却电子束之间的辐射复合;对于重离子束132Xe54+和238U92+,与冷却电子束之间的辐射复合是影响其储存寿命的主要因素。The loss mechanism and lifetime of ion beams in collisions with residual gas, internal target and electrons in e-cooler in heavy ion cooler storage rings were studied. The partial beam lifetimes resulting from various loss mechanisms and the total beam lifetimes of 50-500 MeV/u ^12C^6＋,^36Ar^18＋,^132Xe^54＋ and ^238U^92＋ stored in the experimental ring of the Cooler Storage Ring at the Heavy Ion Research Facility in Lanzhou （HIRFL-CSR） were calculated. The calculations indicate that the charge exchange process between ion beams and the internal target, as well as the radiative recombination process with the electrons in e-cooler restrict the beam lifetime considerably. For heavy ion beams such as ^132Xe54^＋ and ^238U^92＋, the radiative recombination is the dominant loss mechanism.

关 键 词：HIRFL-CSR实验环 离子束 束流寿命 

分 类 号：TL594[核科学技术—核技术及应用] O562[理学—原子与分子物理]