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作 者:徐乐英[1] 尚玉华[1] 郭延风[1] 刘志东[1]
机构地区:[1]中国科学院金属研究所
出 处:《电子显微学报》1998年第1期78-82,共5页Journal of Chinese Electron Microscopy Society
基 金:自然科学基金
摘 要:本文用电子探针测量中的薄膜模型法测定了八种元素对BKα射线的质量吸收系数,与文献上查得的数据相比相差甚大。用几套数据代入修正公式进行反算,得到的强度比与实验测量的标准硼化物的强度比进行比较指出,我们的数据符合得较好。Abstract Mass absorption coefficient (MAC) of BKα by eight elements was measured by means of EPMA with thin film model. In order to compare the accuracy of the MACs of the present work with that from references, the correction function was used to reversely calculate the X ray intensity ratio from MACs of present work and two sets MACs from reference separately. the results show that the X ray intensity ratio obtained from the present set of MACs is of better agreement with the ratio experimentally measured values.
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