热噪声对约瑟夫森结I-V特性及微波感应台阶的影响研究  

Influence of the thermal noise on the Josephson junction

作　　者：刘飞连[1] 周铁戈[1] 赵新杰[1] 方兰[1] 阎少林[1] 

机构地区：[1]南开大学电子系,天津300071

出　　处：《低温与超导》2008年第12期28-31,共4页Cryogenics and Superconductivity

摘　　要：采用数值仿真的方法研究了热噪声对约瑟夫森结I-V特性及微波感应台阶的影响。研究表明,热噪声导致约瑟夫森结的I-V特性曲线呈现"圆拱化",也使得微波感应台阶高度减小。得出了取不同约瑟夫森结临界电流和结电阻时。Authors studied the influences of thermal noise on the I - V characteristics and Shapiro step of Josephson junctions by numerical simulation. The results show that the existence of thermal noise makes I - V curve arc shape and reduces the step height. The principle of thermal noise influence on Shapiro step was also obtained.

关 键 词：约瑟夫森结 热噪声 I-V特性 微波感应台阶 

分 类 号：TM221.014[一般工业技术—材料科学与工程] O511[电气工程—电工理论与新技术]