军用电子元件在强应力场中动态测试技术研究  

Study on Dynamic Testing Technique for Military Electronic Components under High Stress Field

作　　者：顾强[1] 张亚[1] 李波[1] 徐莉红 

机构地区：[1]中北大学机电工程学院,太原030051 [2]山西北方惠丰机电有限公司,山西长治046012

出　　处：《弹箭与制导学报》2008年第6期291-293,共3页Journal of Projectiles,Rockets,Missiles and Guidance

基　　金：教育部科学技术研究重点基金(208024);山西省自然科学基金(2007011054)资助

摘　　要：选择典型的军用电子元件——军用电阻和电容,模拟高温和高过载强应力场,设计相关动态测试电路和试验方案进行试验。通过试验数据分析,得到了军用阻容元件在高温条件下的参数预测模型和参数变化规律,并对阻容元件参数在高过载条件下的瞬时不稳定波动的现象进行了探讨,对提高军用电子产品的可靠性寿命具有一定的参考价值。Dynamic testing experiments and test scheme were carried out to test the parameters of typical military electronic components, military resistance and capacitance in high temperature and high mechanical stress overloading, and the prediction model and variation law of the parameter were obtained in high temperature, then instant instable motion of parameters under high mechanical stress overloading was discussed by analyzing experimental results , which can offer some reference to lifetime extension of military electronic device.

关 键 词：军用电子元件 强应力场 动态测试 参数变化规律 

分 类 号：TN606[电子电信—电路与系统]