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作 者:贾丹平[1] 贾婷[1] 苑玮琦[1] 林应文[1]
机构地区:[1]沈阳工业大学信息科学与工程学院,沈阳110178
出 处:《仪器仪表学报》2008年第12期2581-2586,共6页Chinese Journal of Scientific Instrument
基 金:辽宁省自然科学基金(20052044);辽宁省教育厅(202063304)资助项目
摘 要:发现高精度荧光测温时,荧光寿命与荧光强度有关,表现为激励光源强度、光传输效率、通道放大倍数等影响测量结果,原因在于荧光余辉不是准确的指数变化,它可能导致以荧光余辉指数变化为前提推导的结论要重新考虑其适用范围。论证了实际荧光余辉偏离指数的程度与光谱形状的关系。提出了余辉曲线截断归一化法,用来比较不同材料的余辉偏离指数程度的大小。指出多指数拟合法可以减少非指数分量对测量的影响,给出了数值示例。As the measurement precision towards higher level in a fluorescence temperature measurement system, it is found that the fluorescent lifetime is related to its intensity, which makes the lifetime changing with many factors such as the intensity of exciting light, the light transmission efficiency and the amplification factor of the channel. This is because the fluorescent decay can not be treated as an exact exponential variation. Therefore, the suitable usage extend of some conclusions based on exponential fluorescence need to be reconsidered. The relationshi Pbetween the non-exponential component of fluorescent decay and the light spectra is analyzed. A truncation and normalization method is given to measure the non-exponential degree of the fluorescent decay curve. It is pointed out that multi-exponential data fitting method may be used to reduce the impact of the non-exponential components on measurement result. Numerical example is also given.
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