离心沉积成膜法在AFM表征纳米粉体中的应用  

Application of AFM in the Characterization of Nano-powder by Acentric-deposition Film Fromed Method

作　　者：李酽[1] 刘传生[1] 凤慧云[1] 张楠[1] 李根[1] 

机构地区：[1]中国民航大学南院理学院,天津300300

出　　处：《纳米科技》2008年第6期50-52,共3页

基　　金：天津市自然科学基金（05YFJMTC12900）：中国民航大学科研基金（07KYS05）

摘　　要：研究了原子力显微镜在表征纳米粉体微观形貌中的应用，介绍了离心沉积成膜制备纳米粉末待测试样的方法。结果表明，与普通的沉淀成膜法制样相比，离心沉积成膜法以云母片为基底材料，在分散液中加入了凝聚剂，AFM表征结果表明，离心沉积成膜法使纳米粉体的微观形貌在测试中能更好地反映。该方法拓宽了原子力显微镜在表征粉末状样品微观形貌上的应用。The application of Atomic force microscopy （AFM） in the characterization of nano-powder microcosmic morphology have been studied, the preparation of untest nano-powder sample via the film formed by acentric-deposition method have been introduced. Compared with the normal deposition method, when sample of unrest power are prepared by acentric-deposition method, the mica is used as substrate and flocculant is added to the solution. Results of FM test show that the microcosmic morphology of the film prepared by acentric-deposition method can be reflected more clearly. This method expanded the application of Atomic force microscopy in the characterization of powder sample microcosmic morphology.

关 键 词：离心沉积成膜法 原子力显微镜 表征 微观形貌 

分 类 号：TH742[机械工程—光学工程]