Separating Overlapped Peaks of SF6 Decomposed Products Based on Iterative Curve-fitting Method  

作　　者：ZHANG Xiao-xing XIE Yan-bin YAO Yao TANG Ju REN Jiang-bo 

机构地区：[1]State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, Chongqing 400044, China

出　　处：《高电压技术》2008年第12期2708-2712,共5页High Voltage Engineering

基　　金：Project Supported by National Natural Science Foundation of China （ 50777070）, Science and Technique Project of Chongqing （CSTC, 2007AC2041 ）.

摘　　要：The SF6 decomposed products are very alike,so the peaks of the SF6 decomposed products are overlapped.It make us hard to quantitatively calculate.This paper introduced a method to separate the overlapped chromatogram peaks with iterative curve-fitting and Gauss function,and deduced the formula of the iterative curve-fitting;provided a method to calculate the initial value of the peaks intensity and width by iterative formula,and confirm the final peaks intensity and width to separate the overlapped signals.By the analysis of the real chromatogram data,it proved the validity of this method on the main components used in distinguishing the GIS internal defects.This method overcomes the influence of SF6 peak to the other thin concentration peaks,so it can be used in the study of the quantitative analysis of the decomposed products on different failures and different voltages.The SF6 decomposed products are very alike,so the peaks of the SF6 decomposed products are overlapped.It make us hard to quantitatively calculate.This paper introduced a method to separate the overlapped chromatogram peaks with iterative curve-fitting and Gauss function,and deduced the formula of the iterative curve-fitting;provided a method to calculate the initial value of the peaks intensity and width by iterative formula,and confirm the final peaks intensity and width to separate the overlapped signals.By the analysis of the real chromatogram data,it proved the validity of this method on the main components used in distinguishing the GIS internal defects.This method overcomes the influence of SF6 peak to the other thin concentration peaks,so it can be used in the study of the quantitative analysis of the decomposed products on different failures and different voltages.

关 键 词：曲线拟合法 SF6分解组分 重叠色谱峰 分离 高斯函数 

分 类 号：TM835[电气工程—高电压与绝缘技术]