基于单片机和FPGA的频率特性测试仪  

Frequency characteristics test instrument based on MCU and FPGA

作　　者：张春水[1] 张佳培[1] 

机构地区：[1]武汉大学电子信息学院,湖北武汉430079

出　　处：《电子设计工程》2009年第1期64-65,68,共3页Electronic Design Engineering

摘　　要：介绍基于89S51单片机和FPGA的频率特性测试仪的设计。该系统设计利用DDS原理由FPGA经D/A转换产生扫频信号,再经待测网络实现峰值检测和相位检测,从而完成了待测网络幅频和相频特性曲线的测量和显示。经过调试,示波器显示待测网络频率范围100 Hz～100 kHz的幅频和相频特性曲线,该系统工作稳定,操作方便。The design of frequency characteristic test intrument based on 89S51 single chip microcomputer and FPGA is introduced in this paper.Adopting DDS theory,the system design can produce sweeping signals through FPGA and D/A converter, and can complete the peak detect and phase detect through mesasuring network.So that the system can complete amplitude frequency and phase frequency charactertics cure measurement and display in the measuring network.After experi-ment, the two response frequency characteristics cures range is from 100Hz to 100kHz,and display on the oscillograph.The system work stably,and is easy to operate.

关 键 词：频率特性测试仪 直接数字频率合成 幅频特性 相频特性 单片机 

分 类 号：TM935[电气工程—电力电子与电力传动]