有Al激光器和无Al激光器的工作寿命对比研究  

Study on the Mean Lifetime Comparison of Al-Containing and Al-Free High Power Semiconductor Laser Diodes

作　　者：李雅静[1,2] 安振峰[2] 陈国鹰[1] 王晓燕[2] 杜伟华[1,2] 

机构地区：[1]河北工业大学信息工程学院,天津300130 [2]中国电子科技集团公司第十三研究所,石家庄050051

出　　处：《半导体技术》2009年第1期54-57,共4页Semiconductor Technology

基　　金：国家自然科学基金(60676035);河北省自然科学基金(F2005000084)

摘　　要：为了证明无Al激光器在可靠性方面优于有Al激光器,对InGaAsP/GaAs无Al和AlGaInAs/AlGaAs/GaAs有Al的808 nm大功率半导体激光器进行了常温下电流步进加速老化寿命试验,介绍了半导体激光器寿命试验的理论依据,给出寿命试验的数学模型,据此得到了器件在常温电流步进条件下的寿命,利用最小二乘法拟和得到加速老化的加速方程,从而推算出激光器的特征寿命,分析了有Al激光器和无Al激光器寿命对比结果,提出了材料中含Al对器件可靠性的一些不良影响,无Al激光器可靠性明显优于有Al激光器。In order to prove the reliability of Al-free laser superior to Al-containing laser, accelerated life test was carried out under the conditions of the current step stress at room temperature for 808 nm high power Al-free InGaAsP/GaAs lasers and Al-containing AlGaInAs/AlGaAs/GaAs laser. The theory of laser diode life test and mathematic modal of life test were introduced. Based on the theory, the mean time of the laser diodes under the conditions of the current step stress at room temperature was got. The least squares used for imitating the acceleration of the aging equation, thus the characteristics life of laser was projected. In addition, the mean time comparison of Al-containing and Al-free laser was analyzed. It reveals that several adverse effects to the reliability of the device for Al-containing existe, the reliability of Al-free laser is better than that of Al-containing laser.

关 键 词：有铝激光器 无铝激光器 电流步进 加速老化 寿命 

分 类 号：TN248[电子电信—物理电子学]