光存储酞菁薄膜的加速老化研究  

Studies of Accelerated Aging of Phthalocyanine Films for Optical Storage

作　　者：唐晓东[1] 顾冬红[1] 陈启婴[1] 干福熹[1] 

机构地区：[1]中国科学院上海光机所

出　　处：《中国激光》1998年第4期313-317,共5页Chinese Journal of Lasers

基　　金：863(715-001-0051)资助

摘　　要：采用加速老化试验对光存储酞菁薄膜进行了寿命研究，以反射率的变化作为试验的判断依据。在５５℃，８５％ＲＨ；６５℃，８５％ＲＨ和７５℃，８５％ＲＨ的条件下，测试了反射率随时间的变化关系，用外推法估算出光存储酞菁薄膜的自然寿命。Methodology for determining extrapolated life expectancy values for phthalocyanine (Pc) thin films was investigated. The reflectivity was measured as a function of exposure time for media exposed to 55℃,85%RH, 65℃,85%RH, and 75℃,85%RH. The excellent stability of Pc thin films in studies of accelerated aging was reported.

关 键 词：光存储 酞菁薄膜 加速老化 

分 类 号：TP333.404[自动化与计算机技术—计算机系统结构]