J75不锈钢淬火应力的X射线衍射分析  被引量:2

Stress Analysis of J75 Stainless Steel Aftrer Quenching by X-ray Diffraction

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作  者:孙光爱[1,2] 陈波[1,2] 吴二冬[3] 李秀艳[3] 

机构地区:[1]中国工程物理研究院核物理与化学研究所,绵阳621900 [2]四川大学原子与分子物理研究所,成都610065 [3]中国科学院金属研究所,沈阳110016

出  处:《理化检验(物理分册)》2009年第2期89-93,共5页Physical Testing and Chemical Analysis(Part A:Physical Testing)

摘  要:利用铬靶X射线在侧倾结合固定ψ法基础上对J75不锈钢的(311)面进行了淬火应力测量,得到了不同淬火温度下J75合金试样中心点的残余应力值和近表面微应变效应。结果表明:试样表面残余压应力值在-400^-650 MPa,最大值出现在淬火温度为700℃左右;淬火使衍射峰半高宽由1.25°增加至1.4°以上,显著增加了J75合金的位错等缺陷。受淬火瞬时热应力分布影响,越靠近试样表面衍射峰的宽化越严重。Based on the side tilt and fix ψ method, the (311) plane of quenched J75 stainless steel was measured by X-ray diffraction. The residual stress and micro strain effects of J75 stainless steel surface center in different quenching temperatures were determined. The measurement results showed that the compressed residual stress in the sample surface was between--400 MPa and -650 MPa, the maximal value appeared when quenching temperature was about 700℃. The quenching also causced the increase of FWHM of diffraction peaks from 1.25°to above 1. 4°, so a lot of dislocations and other defect developed and according to the instantaneous heat stress distribution, the nearer the surface was, the larger the diffraction line broadening was.

关 键 词:J75不锈钢 X射线衍射 残余应力 

分 类 号:TG115.222.2[金属学及工艺—物理冶金]

 

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