IC芯片测试设备机械抓手的速度测控  

The Speed Measure and Control of Handler Test Machine

作　　者：朱品昌[1] 袁秀平[1] 茅红伟[1] 倪继锋[1] 

机构地区：[1]上海师范大学电子工程系,上海201418

出　　处：《机床与液压》2009年第2期109-113,共5页Machine Tool & Hydraulics

摘　　要：设计了集成电路芯片测试设备机械手的速度测量装置,考虑了机械手运动过程中的振动以及气缸轴老化、端部生锈所造成的运动速度与行程不稳定因素。根据测控参数对设备进行精确的调整,巧妙地解决了测试设备机械手运动速度与行程控制不良所引发的芯片失效问题,有效地降低了芯片的废品率。Handier test machine was designed which can measure speed and control by using MCU. Factors, such as vibration, the aging of cylinder axes and the end rust that can influence the moving speed and route, were considered into this design during the handler moving process. The test machine can adjust the equipments precisely in accordance with the parameters on measure and con- trol, which solves the invalidation of MCU caused by the unstable running of handler＇s moving speed and route control. The results show that this tool could efficiently reduce the rejects.

关 键 词：机械抓手 IC成品测试界面接口板 比较器 译码电路 数码管 

分 类 号：TP241.3[自动化与计算机技术—检测技术与自动化装置]