光栅光谱仪入射与出射狭缝宽度对测量谱线线宽影响研究  

Investigation on the Entrance Slit Width and Exit Slit Width of Grating Spectrometer on the Measured Spectral Line Width

作　　者：杨晓冬[1] 李正灯[1] 李惠玲[1] 周杰[1] 钟远聪[1] 

机构地区：[1]嘉应学院物理与光信息科技学院,广东梅州514015

出　　处：《嘉应学院学报》2008年第6期38-41,共4页Journal of Jiaying University

基　　金：广东省自然科学基金(8451401501000668)

摘　　要：根据光栅光谱仪衍射方程分析研究了光栅光谱仪入射与出射狭缝宽度对测量谱线宽度影响,研究结果表明光栅光谱仪入射与出射狭缝宽度与测量谱线线宽间满足线性关系,并对理论分析结果进行了实验验证,理论与实验基本符合。The influence of the entrance slit width and exit slit width of grating spectrometer on the measured spectral line width is experimentally and theoretically investigated respectively. The investigation resuits show that the measured spectral line width is linearly dependent on the entrance slit width and exit slit width of grating spectrometer. There is a well agreement between the experimental results and theoreticalresults.

关 键 词：光栅光谱仪 谱线宽度 光谱分辨率 

分 类 号：O433.1[机械工程—光学工程]