新型贮存式氧化物阴极寿命机理的初步探讨  

Lifetime of a new type of reservoir oxide cathode

作　　者：王小霞[1] 廖显恒[1] 罗积润[1] 赵青兰[1] 张晓伟[1] 

机构地区：[1]中国科学院电子学研究所中国科学院高功率微波源与技术重点实验室,北京100190

出　　处：《物理学报》2009年第2期1280-1286,共7页Acta Physica Sinica

基　　金：国家自然科学基金(批准号:50702059)资助的课题~~

摘　　要：对一种新型贮存式氧化物阴极及一种普通氧化物阴极进行了寿命实验,采用XPS分析技术对这两种阴极寿命中不同涂层深度的Ba浓度进行对比分析,结合新型贮存式阴极结构及贮存发射材料的性质对这种阴极的寿命机理进行了探讨.结果表明,新型贮存式氧化物阴极的寿命是普通氧化物阴极的7倍,同时发现新型贮存式氧化物阴极涂层深处保持稳定Ba浓度是其具有长寿命的关键.The lifetime of a new type of reservoir oxide cathode and a conventional oxide cathode was experimentally studied. Concentrations of Ba in different coating depths of the cathodes were analysed by XPS during the lifetime testing process. The mechanism of the reservoir oxide cathode lifetime was discussed according to the analysis results, the cathode structures and the characteristics of the reservoir emission materials. The results show that the lifetime of the reservoir oxide cathode is about seven times that of the conventional oxide cathode. Ba concentration keeps steady in the depth of cathode coating, which plays an important role in the long lifetime of the reservoir oxide cathode.

关 键 词：氧化物阴极 寿命 盈余Ba 贮存发射材料 

分 类 号：O462[理学—电子物理学]