Weibull分布场合下简单步进应力加速寿命试验的最优设计  

The Optimum Simple Stepstress Plans for Accelerated Life Tests with Weibull Distributions

作　　者：施方 葛广平 

出　　处：《上海大学学报（自然科学版）》1998年第3期247-252,共6页Journal of Shanghai University:Natural Science Edition

摘　　要：产品的加速寿命试验被用来较快地获得关于产品寿命分布的信息．加速寿命试验的最优设计，一方面可对产品的各种可靠性指标获得更准确的估计，另一方面也可节省试验的时间和费用．本文研究了Ｗｅｉｂｕｌ分布下简单步加试验的最优设计，考虑了Ｉ型截尾的情形．给出一个例子。Accelerated life tests (ALTS) provide quick information on the lifetime distribution of porducts or materials.Further savings are attributed to a good test plan. On the other hand, it can provide more estimates for the same number of test units and test time. In this paper,we study the optimal plans for simple stepstress ALTS with Weibull distributions and type I censoring.We obtain the optimum test plans to minimize the asymptotic variance of MLE of the mean life at design stress and give an example.

关 键 词：步进应力 最优设计 寿命试验 韦伯分布 可靠性 

分 类 号：O213.2[理学—概率论与数理统计]