X射线衍射图谱背景处理  

Background Editing of X-Ray Diffraction Pattern

作　　者：杨有利[1] 田中青[1] 唐丽文[1] 

机构地区：[1]重庆工学院材料科学与工程学院,重庆400050

出　　处：《重庆工学院学报（自然科学版）》2009年第2期149-151,175,共4页Journal of Chongqing Institute of Technology

基　　金：重庆市科委重点自然科学基金(2005BA4019)

摘　　要：利用CuKα1辐射源带石墨单色器的DX2500型X射线衍射仪测量了化学法制备的LaAlO3粉末.MDI Jade6.5软件在线性、抛物线、三次插样拟合背景,扣除拟合的背景及扣除背景时剥离Kα2等处理后寻峰与自动寻峰得到X射线衍射图谱,分析不同处理方法对衍射角2θ、晶面间距d、与2θ对应衍射峰的FWHM值影响.结果显示,石墨单色器能降低背底强度和增强峰背比,背景对材料分析的影响小.石墨单色器不能滤除Kα2.Kα2对晶体相、空间结构、晶粒度大小的准确性影响显著,在寻峰前要剥离.LaAl03 powder synthesized by chemical method is monitored by DX2500 X-Ray diffraction with graphite monoehromator. The X-ray diffraction （XRD） pattern＇s peaks are researched with MDI Jade6.5 software after no-treatment, fitting background and strip Kα2, removing the fitting baekground and Kα2, especially. The influence of diffraction angle 2θ, crystal plane distance d, and θ diffraction peaks corre- sponding to the FWHM are analyzed with different methods to search peaks. The results show that graphite monochromator can reduce the background intensity and strengthen the ratio of peak and back, and baek- ground does not have to be deducted. However, Kα2 hould be stripped because it can impact the accuracy of the crystal phase, the space structure, and grain size.

关 键 词：X射线衍射 背景处理 Kα2 单色器 

分 类 号：TG174[金属学及工艺—金属表面处理]