Extraction of Parameters of Random Self-Affine Fractal Surfaces from Light Scattered Intensity by Levenberg-Marquardt Algorithm  

作　　者：张宁玉 腾树云 宋洪胜 刘桂媛 程传福 

机构地区：[1]College of Physics and Electronics, Shandong Normal University, Jinan 250014 [2]School of Science, Shandong Jianzhu University, Jinan 250101

出　　处：《Chinese Physics Letters》2009年第3期122-125,共4页中国物理快报（英文版）

基　　金：Supported by the National Natural Science Foundation of China under Grant No 10674085, the Natural Science Foundation of Shandong Province under Grant No Y2006A18, and Shandong Distinguished Middle-Aged and Young Scientist Encourage and Reward Foundation under Grant No 2007BS04031.

摘　　要：A method for simultaneously extracting the parameters of self-affine fractal surfaces from a single experimental profile of scattered intensity data is proposed. The Levenberg-Marquardt algorithm is introduced to fit the theoretical equation for the scattering intensity profile to the experimental data. A precision system is designed for acquisition of scattering intensity data using the Boxcar integration technique. The surface parameters extracted （root-mean-square roughness w, lateral correlation length ζ, and roughness exponent α） are compared to those obtained using atomic force microscopy.A method for simultaneously extracting the parameters of self-affine fractal surfaces from a single experimental profile of scattered intensity data is proposed. The Levenberg-Marquardt algorithm is introduced to fit the theoretical equation for the scattering intensity profile to the experimental data. A precision system is designed for acquisition of scattering intensity data using the Boxcar integration technique. The surface parameters extracted （root-mean-square roughness w, lateral correlation length ζ, and roughness exponent α） are compared to those obtained using atomic force microscopy.

分 类 号：O437.2[机械工程—光学工程]