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作 者:王春川[1]
机构地区:[1]工业和信息化部电子第五研究所,广东广州510610
出 处:《电子产品可靠性与环境试验》2009年第1期65-69,共5页Electronic Product Reliability and Environmental Testing
摘 要:根据光源的不同,介绍了多种常见的人工加速光老化试验方法;从光谱能量、试验条件、后续性能测试、与其它试验项目的组合等方面介绍了人工加速光老化试验;对人工加速老化与自然曝晒的相关性和考察侧重点进行了评述。Several commonly used artificial accelerated light aging tests with different light sources were imtroduced. The spectrum of the light sources and test conditions used in light aging tests, performance tests after a light aging test, and the sequences arranged with other test items were discussed. The article also discusses correlation between artificial accelerated light aging tests and natural exposure tests, and the main points which should be considered in the correlation were also prescnted.
分 类 号:TN06[电子电信—物理电子学]
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