Polycrystalline GaSb thin films grown by co-evaporation  被引量:1

Polycrystalline GaSb thin films grown by co-evaporation

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作  者:乔在祥 孙云 何炜瑜 何青 李长健 

机构地区:[1]Key Laboratory of Opto-Electronic Information Science and Technology of the Ministry of Education,Key Laboratory of Photo-Electronics Thin Film Devices and Techniques of Tianjin,Institute of Photoelectronic Thin Film Device and Technology,Nankai University

出  处:《Journal of Semiconductors》2009年第3期26-29,共4页半导体学报(英文版)

基  金:supported by the National High Technology Research and Development Program of China (No. 2004AA513020).

摘  要:We report optical and electrical properties of polycrystalline GaSb thin films which were successfully grown by co-evaporation on soda-lime glass substrates. The thin films have preferential orientation of the (111) direction. SEM results indicate that the average grain size of GaSb thin film is 500 nm with the substrate temperature of 560 ℃. The average reflectance of GaSb thin film is about 30% and the absorption coefficient is of the order of 10^4 cm^-1. The optical bandgap of GaSb thin film is 0.726 eV. The hole concentration shows a clear increasing trend as the Ga-evaporation-temperature/Sb-evaporation-temperature (TGa/Tsb) ratio increases. When the Ga crucible temperature is 810 ℃ and the antinomy crucible temperature is 415 ℃, the hole concentration of polycrystalline GaSb is 2 × 10^17 cm^-3 and the hole mobility is 130 cm^2/(V·s). These results suggest that polycrystalline GaSb thin film is a good candidate for the use as a cheap material in TPV cells.We report optical and electrical properties of polycrystalline GaSb thin films which were successfully grown by co-evaporation on soda-lime glass substrates. The thin films have preferential orientation of the (111) direction. SEM results indicate that the average grain size of GaSb thin film is 500 nm with the substrate temperature of 560 ℃. The average reflectance of GaSb thin film is about 30% and the absorption coefficient is of the order of 10^4 cm^-1. The optical bandgap of GaSb thin film is 0.726 eV. The hole concentration shows a clear increasing trend as the Ga-evaporation-temperature/Sb-evaporation-temperature (TGa/Tsb) ratio increases. When the Ga crucible temperature is 810 ℃ and the antinomy crucible temperature is 415 ℃, the hole concentration of polycrystalline GaSb is 2 × 10^17 cm^-3 and the hole mobility is 130 cm^2/(V·s). These results suggest that polycrystalline GaSb thin film is a good candidate for the use as a cheap material in TPV cells.

关 键 词:substrate temperature band gap CO-EVAPORATION polycrystalline GaSb films 

分 类 号:TN304.055[电子电信—物理电子学]

 

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