两种常见局部放电缺陷模型的SF6气体分解组份对比分析  

Analysis of SF_6 Gaseous Decomposition Components Under Two Kinds of PD Defects

作　　者：唐炬[1] 李涛[1] 胡忠[2] 肖波[2] 张晓星[1] 

机构地区：[1]重庆大学输变电装备及系统安全与新技术国家重点实验室,重庆400044 [2]重庆市电力公司城区供电局,重庆400010

出　　处：《高电压技术》2009年第3期487-492,共6页High Voltage Engineering

基　　金：国家重点基础研究计划(973)资助(2009CB724506);国家自然科学基金(50777070)~~

摘　　要：为了探讨GIS内不同绝缘缺陷与对应SF6气体分解组份之间的联系,在自建的SF6气体分解试验平台上,构建了两种常见的局部放电缺陷模型,并借助气相色谱仪,对气体组份进行96h的放电跟踪监测。结果显示,两种绝缘缺陷在局部放电发生时,都伴随有SF6气体的分解,检测到的主要分解产物均有SOF2,且其体积分数都随时间的延续而呈现出饱和增长的趋势,但两种缺陷下SOF2的产气特性存在明显差异,使SF6气体分解组份具有不同特征,可以对此两种缺陷进行辨别。In order to determine the relationship between different insulation defects and their decomposed components of SF6 , two typical defect models of partial discharges were constructed and the decomposed components were detected for 96 hours with the gas chromatography. The results show that two types of insulation defects can gener ate decomposed components whose main component is SOF2 and the volume of SOF2 increases with the time. However, the characteristic of generating SOF2 of the two types of experiments are different. In the corona experiment, the CF4 gas can be detected. Therefore, it is concluded that the different defects have different decomposed components which can he used as a feature to recognize defects.

关 键 词：SF6 局部放电 分解组份 气相色谱仪 SOF2 CF4 

分 类 号：TM835[电气工程—高电压与绝缘技术]