光学薄膜激光诱导损伤机理研究(英文)  

Mechanism of Laser-Induced Damage in Optical Dielectric Films

作　　者：黄才华[1] 薛亦渝[1] 夏志林[1] 赵元安[2] 杨芳芳[1] 

机构地区：[1]武汉理工大学汽车工程学院,武汉430070 [2]中国科学院上海光学精密机械研究所,上海201800

出　　处：《光子学报》2009年第3期532-535,共4页Acta Photonica Sinica

基　　金：Supported by National Natural Science Foundation of China(10804090,60708004);Wuhan University of Technology Foundation(xjj2007031)

摘　　要：基于电子密度演化模型,借助数值方法,研究了飞秒激光作用下光学薄膜内的电子密度演化过程,讨论了初始电子密度Ni和激光脉冲宽度τ对光学薄膜激光损伤阈值Fth的影响,分析了激光诱导薄膜损伤过程中MPI和AI的性质和作用.研究结果表明,对应于一定的脉宽,存在一个临界初始电子密度,当Ni低于这一临界密度时,Fth不受Ni影响;当Ni高于临界密度时,Fth随Ni增加而降低.临界初始电子密度随着脉宽的减小而增加。对于FS和BBS介质薄膜,Fth随脉宽的增加而升高。初始电子密度Ni对BBS中的MPI和AI基本没有影响;同样Ni对FS中的AI基本不产生影响,但当Ni>1011cm-3时,FS中MPI电子密度随Ni增加而降低.在所研究的脉宽范围τ∈[0.01,5]ps,AI是FS介质激光诱导损伤的主要机制.而对于BBS,当脉宽τ∈[0.03,5]ps,AI是激光诱导损伤的主要机制;当脉宽τ∈[0.01,0.03]ps,MPI在激光诱导损伤中占主导地位.Based on electron density evolution model, the electron density evolution process induced by femtoseeond laser pulse in optical dielectric films was studied by means of numerical method. The effects of initial electron density Ni and laser pulse width τ on damage threshold fluence F th wire analyzed respectively. Both the nature of multi-photon ionization （MPI） and the role of avalanche ionization （AI） were also discussed. The numerical analysis results show that, for a certain pulse width τ, there is a critical initial electron density below which F th is not affected by Ni and above which F th decreases with the increase of Ni The critical density rises with the decrease of pulse width τ. For the two dielectric films, the damage threshold fluence F th rises with the increase of τ. Initial electron density Ni has little effect on MPI and AI for BBS. For FS, Ni has likewise little effect on AI, and MPI electron density decreases with the further increase of Ni for Ni〉10^11 cm^-3. For FS, the laser-induced-damage is dominated by AI for τ〉 0.01 ps, while for BBS, and MPI takes over for pulse durationτ below 0.03ps.

关 键 词：激光物理 激光诱导损伤 飞秒激光脉冲 多光子离化 雪崩离化 初始电子密度 

分 类 号：TN249[电子电信—物理电子学]