基于扫频技术的散射测量微波暗室设计  

Design of Anechoic Chamber for Scattering Measurement Based on Frequency Scanning Technique

作　　者：赵京城[1] 洪韬[1] 梁沂[2] 

机构地区：[1]北京航空航天大学电子信息工程学院,北京100191 [2]海军装备研究院舰船论证研究所,北京100161

出　　处：《宇航学报》2009年第2期730-734,共5页Journal of Astronautics

摘　　要：传统微波暗室的考核指标是静区场均匀性,对于散射测量来说,这个指标并不能决定测量结果的准确性。在扫频测量系统的基础上,提出一种新的散射测量微波暗室优化设计目标——降低目标区背景噪声。分析了矩形微波暗室中有用信号和干扰信号的分布,指出了两者的不同特征。在理论分析的基础上,提出了降低目标区干扰信号的微波暗室设计方法。最后,给出了在这种设计思想指导下,实际建设的散射测量微波暗室目标区性能指标,其目标区背景噪声比同类普通矩形微波暗室低10dB以上。The inspection of traditional anechoic chamber often focus on the uniformity of field in the quiet zone. But for scattering measurement, this characteristic can＇ t lead to the right result. This paper proposed a new optimize goal for scattering measurement anechoic chamber design-decreasing the background noise of target zone. This paper described the distribution of useful signal and interfering signal in rectangular anechoic chamber, and figured out their difference. Further more, proposed the method of anechoic chamber design for decreasing interfering signal in target zone. At last, target zone characteristic of a real anechoic chamber constructed according to this method is revealed, the background noise of this chamber is 10dB less than similar rectangular anechoic chamber.

关 键 词：散射测量 微波暗室 扫频技术 背景噪声 

分 类 号：V418[航空宇航科学与技术—航空宇航推进理论与工程]