PZT叠层厚膜陶瓷材料性能的研究  

The Study on Properties of PZT Laminated Thick Film Ceramics Materials

作　　者：王立平[1] 卢琳[1] 谢静菁[1] 王聪[1] 姜胜林[1] 

机构地区：[1]华中科技大学电子科学与技术系,湖北武汉430074

出　　处：《压电与声光》2009年第2期263-265,共3页Piezoelectrics & Acoustooptics

基　　金：新世纪优秀人才高校计划资助项目(NCET-04-0703);湖北省青年杰出人才基金资助项目(2006ABB018)

摘　　要：使用凝胶流延成型工艺制备了PZT85/15、PZT95/5单组分厚膜及叠层厚膜。通过和单组分厚膜的性能进行对比,分析了叠层厚膜的形貌特征及介电、铁电和热释电性能。结果表明,由PZT85/15和PZT95/5组成的叠层厚膜内部均匀致密,具有良好的介电、铁电和热释电性能,极化后的相对介电常数rε=191.5,介电损耗tanδ=0.7%(温度T=20℃,频率f=1 kHz),热释电系数在41℃时达到峰值8×10-8C/cm2.K,此后下降不明显,从而改善了单组分厚膜相变温区过窄的缺点,达到拓宽相变温区的目的,有望在红外探测和相变换能方面得到更广泛的应用。In this paper, PZT95/5,PZT85/15 monolayer as well as PZT laminated thick films were prepared using the method of gel-tape-casting. Comparing these films, It was found that the laminated thick film had dense and uniform microstructure. Besides, its dielectric, ferroelectric and pyroelectric properties were proved good. After polarization, the relative dielectric constant ετ of the laminated thick film was 191.5 and dielectric loss tan 8 was 0.7% （T= 20℃, f= 1 kHz）. The pyroelectric coefficient didn＇t descend after reaching the peak of 8× 10^-8 C/cm2· K at 41℃ when FRL-FRH phase transition happened. Thus, the temperature of phase transition could be expanded in order to be widely applied to infrared detecting and heat-electric energy converting.

关 键 词：叠层厚膜陶瓷材料 PZT 低-高温相(FRL-FRH)相变温区 

分 类 号：TM221[一般工业技术—材料科学与工程]