Z箍缩等离子体高分辨X辐射谱诊断  

High spectral resolved X-ray dignosis for Z-pinch plasmas

作　　者：叶凡[1,2] 李正宏[2] 薛飞彪[2] 秦义[2] 徐荣昆[2] 金永杰[1] 

机构地区：[1]清华大学工程物理系,北京100084 [2]中国工程物理研究院核物理与化学研究所,四川绵阳621900

出　　处：《强激光与粒子束》2009年第2期307-310,共4页High Power Laser and Particle Beams

基　　金：国家自然科学基金项目(10035030)

摘　　要：为了获取丝阵Z箍缩等离子体高能谱分辨的X辐射图像,建立了云母球面弯晶X光摄谱仪,根据色散平面内球面弯晶诊断空间分布X光源的几何模型分析了摄谱仪的能谱分辨,计算结果与光线追迹方法得到的结果吻合。当探测器位于罗兰圆上时,系统具备最优能谱分辨。在"强光一号"装置上,利用该摄谱仪诊断了镀镁铝丝阵负载Z箍缩等离子体的X辐射图像,结果表明,该球面弯晶摄谱仪的能谱分辨率高于1 000。Abstract： resolution simultaneously from Z-pinch plasmas, an X-ray spectrograph with spherical bent mica crystal was set up. A geometric model was presented to describe the line broadening due to source size in the dispersion plane. The spectral resolution from this model which was consistent with that from ray tracing calculations showed that the best spectral resolution could be obtained when the detector was placed on the Rowland circle. X-ray spectrograph from aluminum wire array Z pinch implosion was recorded on ＂QiangGuang-I＂ generator, which indicated spectral resolution of better than 1 000.

关 键 词：Z箍缩 X光谱诊断 高能谱分辨 球面弯晶摄谱仪 等离子体 

分 类 号：O536[理学—等离子体物理] TL65[理学—物理]