高纯氧化镧中微量稀土杂质的化学光谱法测定  

DETERMINATION OF TRACE RARE EARTH IMPURITIES IN THE HIGHPURITY LANTHANUM OXIDE BY CHEMICAL SPECTROGRAPHIC ANALYSIS

作　　者：王淑英[1] 李武帅[1] 晏学晨[1] 彭春林 

机构地区：[1]中国科学院长春应用化学研究所国家电化学和光谱研究分析中心

出　　处：《光谱学与光谱分析》1998年第1期63-66,共4页Spectroscopy and Spectral Analysis

摘　　要：本文介绍了高纯氧化镧中微量稀土杂质的化学光谱测定，将Ｌａ２Ｏ３通过Ｐ５０７萃淋树脂分离富集，将大量基体分离掉，剩下微量的稀土杂质，用Ｃ粉吸附后加ＫＢＨ４做载体进行光谱测定。本方法可测定９９．９９９９％纯度的Ｌａ２Ｏ３中的微量稀土杂质。The determination of trace rare earth impurities in the highpurity Lanthanum oxide by chemical spectrographic analysis is reported in this paped.The matrix,La2O3,was separated by the extractioneluating resin P507.The remained rare earth impurities were absorpted by carbon powder.The rare earth impurities absorpted were determinated in carrier KBH4 by spectrographic analysis.The trace rare earth impurities in 999999% La2O3 can be determinated by this method.

关 键 词：高纯氧化镧 化学光谱法 稀土杂质 氧化镧 

分 类 号：O614.33[理学—无机化学]