Implementation and Analysis of Probabilistic Methods for Gate-Level Circuit Reliability Estimation  

作　　者：王真 江建慧 杨光 

机构地区：[1]Key Laboratory of Embedded Systems and Service Computing,Ministry of Education of Shanghai [2]Department of Computer Science and Technology,Tongji University

出　　处：《Tsinghua Science and Technology》2007年第S1期32-38,共7页清华大学学报（自然科学版（英文版）

基　　金：the National Basic Research and Development (973) Program of China (No. 2005CB321604);the National Natural Science Foundation of China (No. 90207021)

摘　　要：The development of VLSI technology results in the dramatically improvement of the performance of integrated circuits. However, it brings more challenges to the aspect of reliability. Integrated circuits become more susceptible to soft errors. Therefore, it is imperative to study the reliability of circuits under the soft error. This paper implements three probabilistic methods (two pass, error propagation probability, and probabilistic transfer matrix) for estimating gate-level circuit reliability on PC. The functions and performance of these methods are compared by experiments using ISCAS85 and 74-series circuits.The development of VLSI technology results in the dramatically improvement of the performance of integrated circuits. However, it brings more challenges to the aspect of reliability. Integrated circuits become more susceptible to soft errors. Therefore, it is imperative to study the reliability of circuits under the soft error. This paper implements three probabilistic methods (two pass, error propagation probability, and probabilistic transfer matrix) for estimating gate-level circuit reliability on PC. The functions and performance of these methods are compared by experiments using ISCAS85 and 74-series circuits.

关 键 词：soft error soft error rate signal reliability failure probability reliability estimation 

分 类 号：TN791[电子电信—电路与系统]