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作 者:LI Minghua YU Guanghua ZHU Fengwu JIANG Hongwei LAI Wuyan
机构地区:[1]Department of Materials Physics,Beijing University of Science and Technology,Beijing 100083,China [2]Institute of Physics,Chinese Academy of Sciences,Beijing 100080,China
出 处:《Chinese Science Bulletin》2001年第22期1934-1936,共3页
基 金:This work was supported by the National Natural Science Foundation of China (Grant No. 19890310).
摘 要:The NiFe/FeMn bilayers with different buffer layers (Ta or Ta/Cu) were prepared by magnetron sputtering. Results show that the exchange coupling field of NiFe/FeMn fllms with Ta buffer is higher than that of the films with Ta/ Cu buffer. We analysed the reasons by investigating the crystallographic texture, surface roughness and surface segregation of both fllms, respectively. We found that the decrease of the exchange coupling fields of NiFe/FeMn fllms with Ta/ Cu buffer layers was mainly caused by the Cu surface segregation on NiFe surface.The NiFe/FeMn bilayers with different buffer layers (Ta or Ta/Cu) were prepared by magnetron sputtering. Results show that the exchange coupling field of NiFe/FeMn films with Ta buffer is higher than that of the films with Ta/ Cu buffer. We analysed the reasons by investigating the crystallographic texture, surface roughness and surface segregation of both films, respectively. We found that the decrease of the exchange coupling fields of NiFe/FeMn films with Ta/ Cu buffer layers was mainly caused by the Cu surface segregation on NiFe surface.
关 键 词:NiFe/FeMn EXCHANGE coupling field TEXTURE SURFACE ROUGHNESS SURFACE segregation.
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