XRD测定炭素材料的石墨化度  

ON MEASURE OF GRAPHITIZATION OF CARBON MATERIAL BY X-RAY DIFFRACTION

作　　者：钱崇梁[1] 周桂芝[1] 黄启忠[1] 

机构地区：[1]粉末冶金国家重点实验室,长沙410083

出　　处：《粉末冶金材料科学与工程》1999年第4期251-255,共5页Materials Science and Engineering of Powder Metallurgy

基　　金：国家重点工业性试验资助

摘　　要：介绍了用X射线衍射(XRD)测定炭素材料石墨化度的原理和方法,指出:用高纯硅粉作内标校准测量误差是必要的;当炭石墨的衍射线呈现不对称时,必须进行多重峰分离,这说明试样含有不同石墨化度的组分,同时可计算出它们相应的含量。The principle and method for measuring graphitization degree of carbon materials by XRD were investigated. It is meeessary to correct error-measure that the high-pure Silicon powder is used for interstandard material. When the profile of diffraction pattern is no-symmetrical, multiple-peak separation shall be executed. In this case, it is obvious that the sample consists of several components with certain graphitization degree, and the component content can be computed.

关 键 词：XRD 石墨化度 多重峰分离 内标 

分 类 号：TQ127.11[化学工程—无机化工]