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机构地区:[1]Institute of Automation, Fuzhou University, Fujian 350002
出 处:《Journal of Electronics(China)》1994年第2期116-122,共7页电子科学学刊(英文版)
摘 要:This paper describes why the k-dimension maximal oriented energy subspace of the measurable voltage-change matrix id the optimal feature to locate faults in a population of circuits. The paper elaborately designs a "nearness" concept, which is used to construct a fault candidate set in a small size, and proposes a maximal nearness criterion. On the basis of these, the paper presents a novel algorithm to efficiently improve the accuracy and speed of fault locating.This paper describes why the k-dimension maximal oriented energy subspace of the measurable voltage-change matrix id the optimal feature to locate faults in a population of circuits. The paper elaborately designs a 'nearness' concept, which is used to construct a fault candidate set in a small size, and proposes a maximal nearness criterion. On the basis of these, the paper presents a novel algorithm to efficiently improve the accuracy and speed of fault locating.
关 键 词:FAULT diagnosis ORIENTED ENERGY SUBSPACE distance ANALOG CIRCUITS
分 类 号:TN27[电子电信—物理电子学]
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