高压断路器断口均压电容器介质损失角增大原因分析及解决措施  

Analysis of Grading Capacitor tanδ Expansion for High Voltage Circuit Breaker

作　　者：孙鹏举[1] 吕洪明[1] 

机构地区：[1]安徽淮北供电公司,安徽淮北235000

出　　处：《高压电器》2009年第2期97-98,105,共3页High Voltage Apparatus

摘　　要：笔者通过对高压断路器均压电容器均压原理论述以及损耗的产生和tanδ值易于偏大的原因分析,着重介绍了电容介质材料在交流电压作用下的极化损耗和电导损耗,解析了均压电容器在各种场强下tanδ的变化情况,并提出了降低离子杂质体积分数以改善tanδ增大的解决措施。This paper analyzes the principle of a grading capacitor in a high voltage circuit breaker, its losses, and the cause of tanδ expansion, giving emphasis on polarization loss and dielectric loss of the dielectric material under alternate voltage. The variation of a grading capacitor tanδ under different field intensities is also analyzed. In addition, a method to suppress tanδ expansion is suggested by reducing ionic contaminations.

关 键 词：均压电容器 损耗角正切TANΔ 杂质 

分 类 号：TM561[电气工程—电器]