智能卡COS芯片层模块设计与测试方案研究  

Research on Design and Testing Scheme of Smart Card COS Chip Module

作　　者：张李静[1] 张秋燕[1] 

机构地区：[1]天津理工大学电子信息与通信工程学院,天津300191

出　　处：《现代电子技术》2009年第4期27-30,共4页Modern Electronics Technique

摘　　要：设计了智能卡操作系统底层驱动模块和FLASH读写模块,并提出针对这些模块函数的测试方案。首先介绍智能卡操作系统的基本概念和智能卡硬件的基本结构;然后以接触式智能卡为例,从芯片的硬件结构出发,提出COS操作系统通信和硬件模块以及操作系统的异常处理机制的设计方案,并提出一种操作系统底层的测试方案,即Testing COS。这里从COS性能的角度出发设计底层模块,并提出针对底层模块函数的测试方案。A bottom drive module of smart card and the read and write module of FLASH are designed,and a programme to test the functions of these modules is proposed. First, it introduces the basic concept of the COS and the basic construction of the chip＇s hardware. Then, takes the contact chip as an example, proposes communication and hardware module and the anomaly handling mechanism of the COS based on the chip＇s hardware. At the same time,it supplies a testing programme of bottom of the operating system, namely Testing COS. The bottom module is designed based on the performance of COS, and testing method of the bottom module is put forward.

关 键 词：操作系统 ISO7816-3 测试模块 TestingCOS 

分 类 号：TP368.1[自动化与计算机技术—计算机系统结构]