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作 者:郑国恒[1] 薛妤[1] 苏建坡[1] 常磊[1] 黄新超
机构地区:[1]郑州大学物理工程学院,郑州450001 [2]河南省锅炉压力容器安全科学研究院,郑州450004
出 处:《无损检测》2009年第4期303-306,共4页Nondestructive Testing
摘 要:为提高测量精度和范围,简化仪器结构,提出采用集成光频转换芯片TSL230直接对光信号进行测量,将高、低频率分开采样,输出频率经计数、分频后送于单片机,采用计数法和测周期法进行数据处理,同时对测量数据进行了校正。实验证明此方案减小了分布参数及其它外界参数的影响,稳定了测量结果,提高了测量精度,扩大了测量范围,有较好的推广价值。In order to improve the testing precision and range and to simplify the structure of the apparatus, the design, according to the new black and white densimeter's need, puts forward to use the integrated chip light-to- frequency converter TSL230 to measure the light signal directly, and sample the high and low frequency separately. It takes account of and disparts the out frequency first, and then gives the singlechip processor to process the data, using the methord of counting and Cycle testing, and do the error revise and modification simultaneity. The experiment testified that the method minimized the effect made by the distribute factors and other external factors, stabilized the testing results, improved the testing precision and extended the testing extension. The results showed that the device could meet the need of testing and have the better value to popularize.
关 键 词:射线检测 黑白密度计 集成光频转换芯片 单片机 频率测量 误差校正
分 类 号:TG115.28[金属学及工艺—物理冶金]
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