片状元件的自动光学检测算法  

Automatic Optical Inspection Algorithm for Chip Component

作　　者：武剑洁[1] 王永欣[1] 邱德红[1] 方少红[1] 

机构地区：[1]华中科技大学软件学院,武汉430074

出　　处：《计算机工程》2009年第7期198-199,208,共3页Computer Engineering

基　　金：国家部委基金资助项目

摘　　要：表面贴装自动光学检测算法大多存在计算速度慢或对元件位置差异及图像变异敏感的问题。该文针对片状元件提出一种检测算法,根据元件局部特征区域的灰度变化,通过引入局部主波概率,利用主波特性描述标本图像与被测元件图像之间的相似度,从而判断元件是否存在缺陷并确定缺陷种类。实验表明,该算法可缩小检测范围,降低计算量,提高算法适应性。To solve the problem of high sensitivity to position of component that exists in the algorithms widely used in Automatic Optical Inspection（AOI） for chip component, an automatic optical inspection algorithm is presented. The gray-level change of component image in local feature region is used as a detection criterion. By introducing local principal wave probability, the similarity between sample image and inspected image is described by intrinsic characteristic of the principal wave. Thus it can be decided whether the component is a defective one. The type of defect can be concluded. Experimental results show that the algorithm is effective.

关 键 词：自动光学检测 片状元件 局部主波概率 

分 类 号：TP311[自动化与计算机技术—计算机软件与理论]