数字像面全息双曝光法测量物体位移的研究  

Study on Object Displacement Measure Using Double-exposure Digital Image Hologram Method

作　　者：杨坤[1] 刘喆[1] 王文生[1] 

机构地区：[1]长春理工大学光电工程学院,长春130022

出　　处：《长春理工大学学报（自然科学版）》2009年第1期25-27,共3页Journal of Changchun University of Science and Technology(Natural Science Edition)

基　　金：总装备部预研项目(9140A17060306BQ0303)

摘　　要：采用数字像面全息图与双曝光干涉法相结合测量物体位移,有效地增强了物光强度,提高了干涉图像的对比度,得到了清晰的干涉图像;并将面阵CCD与电寻址液晶EALCD相结合用于全息再现,成功地避免了传统的全息记录材料显影、定影、全息图复位过程以及材料非线性记录等缺点,取得了较好的实验效果。Digital image hologram with double-exposure method is used to measure displacement of an object in this paper, the intensity of object light has been increased effectively, the contrast of interference fringes has been improved, clear interference fringes has been gotten. CCD and EALCD are applied in order to reconstruct the digital hologram, so the developing, fixing and relocation of traditional hologram recording material are avoided successfully, and so the drawback of nonlinear recording. Better experimental result has been achieved.

关 键 词：像面全息 双曝光法 物体位移 EALCD 

分 类 号：TN26[电子电信—物理电子学]