激光脉冲法研究半透明PI/SiO_2薄膜的热扩散率  

Thermal Diffusivity Research of PI/SiO_2 Films by Laser Flash Method

作　　者：陈新贵[1] 郭敬东[1] 王宝全[1] 何冠虎[1] 

机构地区：[1]中国科学院金属研究所沈阳材料科学国家(联合)实验室,辽宁沈阳110016

出　　处：《高分子材料科学与工程》2009年第4期109-111,115,共4页Polymer Materials Science & Engineering

基　　金：国家自然科学基金资助项目(50706057)

摘　　要：激光脉冲法在应用于测量对实验探测波段红外线半透明的材料热扩散率时遇到了困难。文中提出了新的解决办法：即通过对理论探测曲线进行分析，并通过在实际探测曲线上的升温幅度和特征点计算得到了热扩散率，成功地解决了这一难题。在-73℃～290℃的范围内获得了对激光和红外线都是半透明的聚酰亚胺（PI）薄膜的热扩散率，并研究了室温下PI／SiO2复合材料的热扩散率随SiO2含量的变化规律。Laser flash method was succeeded in thermal diffusivity t, and with the heat capacity and density, the thermal conductivity can be calculated out. But it is difficult to apply this method in the thermal diffusivity measurement of semitransparent materials, especially for those materials which were semitransparent both in the infra-red wave length of laser beam and detector. In this paper, a new method has been made up to solve this problem. The diffusivity of polyimide （PI） film was measured in the temperature range of - 73 ℃ -290 ℃ and the thermal diffusivity of PI/SiO2 composite films with different content of SiO2 were researched also.

关 键 词：激光脉冲法 半透明材料 热扩散率 PI/SiO2复合材料 

分 类 号：TB383[一般工业技术—材料科学与工程]