覆盖率驱动的随机测试生成技术综述  

A Survey on Coverage Directed Generation Technology

作　　者：沈海华[1] 卫文丽[1,2] 陈云霁[1] 

机构地区：[1]中国科学院计算技术研究所微处理器技术研究中心,北京100190 [2]中国科学院研究生院,北京100049

出　　处：《计算机辅助设计与图形学学报》2009年第4期419-431,441,共14页Journal of Computer-Aided Design & Computer Graphics

基　　金：国家“八六三”高技术研究发展计划(2008AA110901,2007AA01Z112);国家自然科学基金(60603049);北京市自然科学基金(4072024)

摘　　要：随机测试生成技术是当今大规模集成电路仿真验证流程中的一项重要支撑技术.覆盖率驱动的随机测试生成方法是目前该领域研究的热点之一,其目标是通过覆盖率指导测试向量生成,减少重复测试向量,加速验证的收敛过程,提高验证的自动化程度和效率.文中全面综述了覆盖率驱动的随机测试生成技术的发展历程、研究现状和技术分类,并结合具体实例对各种方法及其面临的主要问题进行了讨论、评价和总结.Random test generation technology is one of the most important methods for the verification of modern VLSI. Coverage directed test generation is one of the hot topics in this area, it automates the feedback from coverage analysis to test generation to increase the efficiency and quality of the verification process and reduce the time and effort needed to implement a verification plan. So far, considerable efforts have been invested in coverage directed test generation to find good ways to automate the process of effective bias generation. In this paper, we give a deep discussion and analysis the research and practice of coverage directed test generation technology. We also give our remarks and advices on different methods in coverage directed test generation technology.

关 键 词：验证 VLSI 随机测试生成 覆盖率驱动的测试生成 

分 类 号：TP302[自动化与计算机技术—计算机系统结构]