平行光束在单层弱吸收Ⅱ型界面上反射时的纵向位移  

The Longitudinal Displacement of Parallel Beam Reflected from a Single Layer Weakly Absorbing Type-II Dielectric Interface

作　　者：张纪岳[1] 刘宝盈[1,2] 李春芳[1,3] 段弢[1] 

机构地区：[1]中国科学院西安光学精密机械研究所瞬态光学与光子技术国家重点实验室,陕西西安710119 [2]商洛学院物理与电子信息工程系,陕西商洛726000 [3]上海大学物理系,上海200444

出　　处：《商洛学院学报》2009年第2期3-7,共5页Journal of Shangluo University

基　　金：国家自然科学基金项目(60377025);陕西省教育厅专项科研基金项目(06JK306)

摘　　要：提出了单层弱吸收II型界面的一种构型,分析了TE偏振的平行光束在这种界面上反射时的纵向位移,并进行了计算。结果表明,存在着一个临界角,当入射角小于临界角时,其纵向位移随入射角的增大而增大,而当入射角大于临界角时,纵向位移则随入射角的增大而减小。此外,还分析了纵向位移随介质层厚度以及折射率等参数的变化情况。A single layer weakly absorbing type-Ⅱ dielectric interface is proposed, and the longitudinal displacement of the TE-polarized parallel beam reflected from this kind of interface is investigated and calculated. It shows that there exists a critical angle, the longitudinal displacement increases with the incident angle increasing when the incident angle is smaller than the critical angle; however, the longitudinal displacement decreases with the incident angle increasing when the incident angle is larger than the critical angle. Moreover, the longitudinal displacement changing with other parameters is investigated, such as the thickness and the refractive index of the dielectric layer.

关 键 词：平行光束 弱吸收介质 反射 纵向位移 

分 类 号：O435.1[机械工程—光学工程]