表面修饰PEO薄膜的等温结晶动力学  

Isothermal Crystallization Kinetics of Surface-modified Poly(ethylene oxide) Films

作　　者：袁清华[1] 张志英[1] 董知之[1] 王曙光[1] 王冬梅[1] 肖长发[1] 

机构地区：[1]天津工业大学材料科学与化学工程学院,改性与功能纤维重点实验室,天津300160

出　　处：《材料科学与工程学报》2009年第2期238-242,共5页Journal of Materials Science and Engineering

基　　金：天津市重点实验室天津市科技发展计划资助项目(06TXTJJCI4400);天津工业大学"重中之重"人才配套资助项目(20060526)

摘　　要：采用表面修饰技术对不同厚度的PEO薄膜进行修饰,通过DSC结晶曲线研究表面修饰PEO薄膜厚度对等温结晶过程的影响。结果发现:表面修饰PEO薄膜厚度小于晶核间的平均距离(≤188μm)时,结晶体的生长方式发生转变,表现在Avrami图形上就是在结晶初期出现了一个转折点,结果表明该转折点是结晶体在生长过程中由三维生长模式向二维生长模式转变的表现。The confined crystallization behavior of surface-modified poly（ethylene oxide） （PEO） films at different thickness was studied using differential scanning calorimeter. The data were analyzed by the Avrami equation. The results show that a primary turning point appears in the Avrami plot in the very beginning of the crystallization process, the primary turning point is an indication of a transformation of crystal growth geometry from a three-dimensional mode to a twodimensional one, and a transformation of the growth geometry of an entity emerges when the thicknesses were less than 188μm.

关 键 词：一维受限 PEO Avrami方程 等温结晶 

分 类 号：TQ320.1[化学工程—合成树脂塑料工业]