模拟电路故障诊断测试节点优选新算法  

New Algorithm for Test Node Selection for Analog Circuits Diagnosis

作　　者：王亮[1] 刘光斌[1] 徐金华[1] 

机构地区：[1]西安第二炮兵工程学院,陕西710025

出　　处：《微计算机信息》2009年第13期177-178,207,共3页Control & Automation

基　　金：申请人:刘光斌;第二炮兵装备改革重点项目;颁发部门:第二炮兵装备部(编号不公开)

摘　　要：针对模拟电路故障诊断测试节点优选问题,采用粗糙集中二进制可辨矩阵的概念,将模拟电路故障诊断节点优选转化为求信息系统的最优约简。以求核作为约简的基础,给出了新的测试节点优选算法。最后,给出了新算法的应用实例,利用MATLAB程序验证了算法的有效性。To solve the problem of test node selection for analog circuits, the concept of binary discernable matrix in rough set theory is used to transform test node selection for analog circuits to reduction for knowledge system. Based on searching algorithm for cores in reduct calculation, new selection algorithm is developed. Finally, an example is given to show and a computer program written with MATLAB is presented to attest efficiency of algorithm.

关 键 词：故障诊断 粗糙集 二进制可辨矩阵 核 约简 测试节点 模拟电路 

分 类 号：TP391.9[自动化与计算机技术—计算机应用技术]