相位物体的相位检测分析方法  

The analysis method for phase measurement of phase object

作　　者：黄妙娜[1] 黄佐华[1] 

机构地区：[1]华南师范大学物理与电信工程学院,广东广州510631

出　　处：《大学物理》2009年第4期6-10,共5页College Physics

基　　金：广东省工业攻关资助项目(2006B12901020)

摘　　要：介绍了相位物体的相位检测方法,包括传统的暗场法、纹影法和相衬法,重点介绍基于图像处理的相位物体的双点源光束干涉测量与扫描成像方法,并比较它们的优缺点,同时对目前的研究进展进行了综述.Some phase measuring methods for the phase object are introduced, which include the tradition dark field, schlieren and phase contrast ones. The method of double point sources interfence scanning image for phased object is introduced especially based on image processing. Their advantages and disadvantages are compared and the development of the current phase measuring research of the phase object is summarized finally.

关 键 词：相位物体 测量方法 图像处理 测量范围 

分 类 号：O436.1[机械工程—光学工程]