软X光多层镜反射率的标定与修正  

Calibration and Amendment of Soft X-Ray Multilayer Mirror Reflectivity

作　　者：侯立飞[1] 易荣清[1] 杜华冰[1] 李朝光[1] 何小安[1] 黎航[1] 刘慎业[1] 朱京涛[2] 赵屹东[3] 崔明启[3] 

机构地区：[1]中国工程物理研究院激光聚变研究中心,四川绵阳621900 [2]同济大学精密光学工程技术研究所,上海200092 [3]中国科学院高能物理研究所,北京100039

出　　处：《光子学报》2009年第4期827-831,共5页Acta Photonica Sinica

摘　　要：在北京同步辐射装置上,利用3W1B束线得到了21°-B4C/Si,21°-B4C/Mo,10°-Cr/Ti,15°-B4C/W,10°-B4C/W以及6.86°-B4C/W等多层镜在50～1500eV能段上的反射率标定曲线.分析了标定结果的不确定度,计算得到多层镜的积分衍射效率,并修正了标定结果.Beijing synchrotron radiation facility （BSRF）-3W1B beam line was used to perform experiments for ML mirrors reflectivity calibration. The reflectivity calibration curves of 21°-B4C/Si, 21°-B4C /Mo, 10°-- Cr/Ti, 15°- B4 C/W, 10°- B4C/W, 6.86°- B4 C/W and 15°- B4 C/W multilayer mirrors were given in the region of 50 -1500 eV. The values of experiment and calculation were compared and analyzed. Then the uncertainty and integral reflection coefficients were given. Then the amendment of calibration data was completed. As a database and theoretical base, these results guarantee ML to be applied well in the ICF experiments.

关 键 词：多层镜 反射率 标定 同步辐射 修正 

分 类 号：TH842[机械工程—仪器科学与技术]