印制板级边界扫描接口线的测试  

Board Testing forBoundary Scan Test Port

作　　者：臧春华 

机构地区：[1]南京航空航天大学电子工程系

出　　处：《数据采集与处理》1998年第1期46-50,共5页Journal of Data Acquisition and Processing

摘　　要：边界扫描设计正逐步成为可测性设计的主流。本文首先简要介绍边界扫描器件的结构，然后详细讨论印制板级边界扫描接口线的故障模型和测试原理，并给出相应的测试电路和测试算法。最后通过一个测试实例说明测试算法的时间特性。The boundary scan design, which is becoming a dominant method of testable design, is briefly introduced. The fault models and test principles for board boundary scan port lines are then discussed in detail. This paper also presents the testing circuit and algorithm for the port lines. Finally the time performance of the testing algorithm is illustrated with an example.

关 键 词：印制板级 边界扫描 接口线 测试 数字集成电路 

分 类 号：TN431.207[电子电信—微电子学与固体电子学]