简立方晶格键和座稀疏横向伊辛系统的临界特性  

CRITICAL PROPERTIES OF THE BOND AND SITE DILUTION TRANSVERS ISING SYSTEM ON SIMPLE CUBIC LATTICE

作　　者：晏世雷[1] 杨传章[1] 

机构地区：[1]苏州大学物理科学与技术学院,苏州215006

出　　处：《苏州大学学报（自然科学版）》1998年第1期42-46,共5页Journal of Soochow University(Natural Science Edition)

摘　　要：本文在有限集团近似的框架内分别研究了自旋1/2简立方晶格键和座稀疏横向伊辛自旋系统的临界特性,获得了相图、临界温度、临界横场和键与座浓度阈值,讨论了横场和键与座浓度对临界温度的影响,并给出了较满意的结果。The critical properties of the bond and site dilution transverse Ising system on simple cubic lattice with spin 1/2 is investigated within the framework of the finite cluster approximation (FCA). The phase diagrams, critical temperature, critical transverse field and percolation threshold are studied. Meanwhile, we discuss the influence of transverse field and bond and site concentration for critical temperature. The FCA method is conceptually as simple as an ordinary mean field approximation (MFA ), but gives much better results.

关 键 词：简立方晶格 伊辛系统 临界特性 

分 类 号：O48[理学—固体物理]