TM polarization characteristics on thermal radiation of a negative refractive index thin film  

作　　者：CUl Yi HUANG Yong LI Wen WAN Jun 

机构地区：[1]School of Aeronautical Science and Engineering, Beijing University of Aeronautics and Astronautics, Beijing 100191, China

出　　处：《Chinese Science Bulletin》2009年第10期1663-1668,共6页

基　　金：Supported by the National Natural Science Foundation of China (Grant No. 50606003);Aeronautic Science Foundation of China (Grant No. 2007ZA51006)

摘　　要：Thermal radiation TM polarization characteristics of a negative refractive index thin film was studied based on the transmit matrix method and Kirchhoff radiation law. The influence of the thin film pa- rameters on the thermal radiation directional characteristics and spectral property were discussed. And the influence of the evanescent waves was also discussed. The results show that two factors play important roles in the thermal radiation of negative index thin film: one is the interference effect of the thin film structure to the electromagnetic waves; the other is the photon tunneling effect of the negative refractive index material, which was caused by the amplifying evanescent wave. These indicate that spectral and directional characteristics of the thermal emissivity can be modulated by modifying the structure and the physics parameters of the negative refraction index thin film.Thermal radiation TM polarization characteristics of a negative refractive index thin film was studied based on the transmit matrix method and Kirchhoff radiation law. The influence of the thin film parameters on the thermal radiation directional characteristics and spectral property were discussed. And the influence of the evanescent waves was also discussed. The results show that two factors play important roles in the thermal radiation of negative index thin film： one is the interference effect of the thin film structure to the electromagnetic waves; the other is the photon tunneling effect of the negative refractive index material, which was caused by the amplifying evanescent wave. These indicate that spectral and directional characteristics of the thermal emissivity can be modulated by modifying the structure and the physics parameters of the negative refraction index thin film.

关 键 词：薄膜参数 负折射率 偏振特性 热辐射 商标 光子隧道效应 光谱性质 方向特性 

分 类 号：O572.31[理学—粒子物理与原子核物理] TM26[理学—物理]