窄道宽磁头边缘磁场读写性能分析  

Analysis of Side Field R/W Effects for Narrow Track Heads

作　　者：卢萍[1] 张江陵[1] 

机构地区：[1]华中理工大学计算机科学与技术学院

出　　处：《华中理工大学学报》1998年第5期69-71,共3页Journal of Huazhong University of Science and Technology

基　　金：国家自然科学基金

摘　　要：对窄道宽磁头边缘磁场进行了深入分析，导出了该磁场的三维解析表达式．结果显示，该表达式具有较高精确度，能够揭示窄道宽磁头最优化设计中几何参数的选择规律．在此基础上，讨论了边沿磁场对写入道宽以及读出性能的影响．At high track density, three dimensional effects are not negligible for the evaluation of narrow track head characteristics such as crosstalk and intertrack guard. In particular, the side fringing fields of narrow track heads cause effective track width to be greater than the physical width. The side fringe fields of narrow track heads have been analyzed in the paper, and analytic expression for the three dimensional field distribution obtained. Then certain consequences are considered: recorded track width and isolated pulse characteristics.

关 键 词：高密度 窄道宽磁头 边缘磁场 读写性能 

分 类 号：TP333.3[自动化与计算机技术—计算机系统结构]