应用双电层模型求取薄互层含水饱和度的方法研究  

Research of Applying Dual-electrical-layer Model for Calculating Water Saturation of Thin-bedded Reservoirs

作　　者：蒋宏娜[1] 孙建孟[1] 徐峰华[2] 蒋伟娜[3] 

机构地区：[1]中国石油大学(华东)地球资源与信息学院,山东东营257061 [2]胜利石油管理局地质录井公司,山东东营257061 [3]中国石油勘探开发科学研究院,北京100083

出　　处：《石油天然气学报》2009年第1期229-233,共5页Journal of Oil and Gas Technology

基　　金：国家自然科学基金项目(40574030)

摘　　要：建立原始含油饱和度解释模型一直是测井技术中不断研究的课题,从最初经典的阿尔奇公式到考虑泥质影响、骨架影响及多重孔隙影响的饱和度模型,都有其自身的优缺点,但这些模型都没有考虑到储集层间薄互层及层间沉积韵律变化的影响,因此无法求准薄储集层的含水饱和度。研究针对薄储集层的地质特点,提出用一种新方法研究电阻率各向异性,即双电层模型,该模型的基本方法是把地层看作电阻率相对较高和电阻率相对较低的两种地层组合。依次介绍了双电层模型的理论依据、基本原理与建立以及其基于常规测井信息进行薄储集层含水饱和度的求取方法,并利用双电层模型对A油田B区块多口井进行实际处理。结果表明,应用双电层模型计算出的含水饱和度与密闭取心井的饱和度有较好的一致性,为薄储集层参数的测井评价探索了一条新的途径。To establish reservoir initial oil saturation interpretation models have always been the perpetual research in well technique,from the initial classical Archie formula to saturation interpretation models considering shale effects,saturation interpretation models considered the effects of conductive mineral and multi-porosity,all have their own advantages and disadvantages,but these interpretation models did not consider the effects of the reservoirs with thin interbeds and the effects of interlayer sedimentary thythm change,so it can not accurately calculate the water saturation of thin-bedded reservoir.In view of geologic characteristics,this paper introduce a new anisotropy analysis method called the Dual-Electrical-Layer model(DEL),this model includes a relatively high resistivity layer and a relatively low resistivity layer.Ordinally it introduces theoretical basis,basic principle and establishes water saturation seeking method,and deals with more oil wells in Block B of oilfield by using DEL model.This paper takes the C Well as an example,to illustrate the effectiveness of the method.The results show that calculated water saturation by DEL model is consistent with sealing core drilling well saturation,explore a new way is provided for the logging evaluation of thin-bedded reservoir parameter.

关 键 词：电阻率各向异性 双电层模型 纵向电阻率 径向电阻率 薄层评价 

分 类 号：P631.84[天文地球—地质矿产勘探]